Method and arrangement for measuring the structures of an object
AssigneeWerth Messtechnik GmbH
InventorRalf Christoph
Life of this patent
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Abstract
The invention relates to a method and an arrangement for measuring the structure of an object. The structure is scanned by touch, by means of a scanning element whose position is optically detected. The force produced after the contact between the scanning element and the object is determined and optionally adjusted to constant values.
Claims19
Method for measuring the structures of an object with a scanning element of a probe that is allocated to a coordinate measuring device and that starts from a flexible shaft of said probe, with the scanning element being brought into contact with the object and then its position being determined with and optical sensor directly or indirectly via at least one reticule, which is allocated to the scanning element, with an optical sensor, characterized by the fact that the shaft, with the exception of a free bending length that comprises the scanning element and/or the reticule, runs within a rigid or basically rigid guiding piece and that the scanning force, which occurs upon contact between the scanning element and the object, is set to a value that has been adjusted to the conditions for the object by specifying the bending length.
Arrangement for measuring the structures of an object, with scanning element (10) that is allocated to a coordinate measuring device, that starts from a flexible shaft (16), that can be brought into contact with the object whose position can then be determined with an optical sensor indirectly or directly with at least one reticule, which is allocated to the scanning element, characterized by the fact that the shaft (12), with the exception of a free bending length (16) comprising the scanning element (10) and/or the reticule, runs within a rigid or basically rigid guiding piece (30).
Dependencies are inferred from the claim text.