Surface profile measurement apparatus
AssigneeMitutoyo Corporation
InventorsTaizo Nakamura, Yoshio Saruki, Tatsuya Narumi, Yasushi Fukumoto
Life of this patent
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Abstract
To provide a surface profile measurement apparatus capable of efficient measurement of the surface profile of an object. A diamond indenter (16) is movably mounted. The tip end of the diamond indenter (16) is irradiated by light, and the light reflected by the tip end (17) is condensed through a lens (46). The condensed light is observed by a photo sensor (42) for measurement of the curvature radius of the tip end (17). Meanwhile, the light reflected by the tip end (17) and the light reflected by a reference body (66) together cause an interference fringe. The interference fringe is observed by a CCD camera (44) to measure the surface profile of tip end (17).
Claims10
A surface profile measurement apparatus for measuring a surface profile of a movably mounted object having a curved surface, comprising:
- an interference optical system for forming an interference fringe of light from a light source reflected by the object and light from the light source reflected by a reference body;
- a surface profile measurement section for measuring the surface profile of the object based on the interference fringe;
- a condenser optical system for condensing the light reflected by the object;
- and
- a curvature radius measurement section for measuring a curvature radius of the object based on variation of the light condensed by the condenser optical system, the variation of the light having a first peak and a second peak while the object is translationally moving, the curvature radius measurement section measuring a curvature radius based on a distance between the first peak and the second peak.
A surface profile measurement apparatus for measuring a surface profile of an object having a partially spherical tip end and a conical substrate and mounted movably, comprising:
- an interference optical system for forming an interference fringe of light from a light source reflected by the object and light from the light source reflected by a reference body;
- a surface profile measurement section for measuring the surface profile of the object based on the interference fringe;
- a condenser optical system for condensing the light reflected by the object;
- and
- a curvature radius measurement section for measuring a curvature radius of the object based on variation of the light condensed by the condenser optical system, while translationally moving the object
- wherein
- the surface profile measurement section measures a conical vertex angle of the object based on variation of the interference fringe created as the object rotates around an axis vertical to an optical axis of light irradiating the object.
A surface profile measurement apparatus for measuring surface profile of an object having a partially spherical tip end and conical substrate and mounted movably, comprising:
- an interference optical system for forming an interference fringe of light from a light source reflected by the object and light from the light source reflected by a reference body;
- a surface profile measurement section for measuring the surface profile of the object based on the interference fringe;
- wherein
- the reference body includes a reference surface and a reference sphere, which are mutually switchable by means of reference body switching means, and
- the surface profile measurement section measures an angle of a conical vertex of the object based on variation of an interference fringe created by the reference surface and the surface of the object, and measures surface profile of the partially spherical tip end of the object based on variation of an interference fringe created by the reference sphere and the object, the interference fringes both being formed as the object rotates around an axis vertical to an optical axis of the light irradiating the object.
Dependencies are inferred from the claim text.