Back to results
US 6,646,734 B1Granted
Method and an arrangement for inspection of and measuring at an object
AssigneeWestinghouse Atom AB
InventorsLars Gärdin, Peder Hellberg
Life of this patent
Estimating the term…
Loading patent…
Loading patent…
AssigneeWestinghouse Atom AB
InventorsLars Gärdin, Peder Hellberg
Estimating the term…
A method and an arrangement for inspection of a test object (1) for stains or pits at its surface and measuring of any stain or pit, where the test object is arranged in an inspection fixture (3) in at least one defied position. A monitoring device (7) and a scanning device (5) are arranged at the inspection fixture and a control unit (9) for controlling the inspection is included in the arrangement. The surface of the test object is monitored by means of the monitoring device (7) and an image, produced by the monitoring device is shown at the control unit. A stain or pit shown by the monitoring device is subsequently scanned by mean of the scanning device and the depth or width of the stain or pit is calculated, dependent of the results of the scanning device.
A method identifying and measuring stains and pits at a surface of a test, wherein the test object is arranged underwater in an inspection fixture and a camera is arranged at the inspection fixture, the method comprising:
An arrangement for underwater inspection of a test object for conspicuous stains or pits at a surface of the test object and measuring the stains or pits, the arrangement comprising:
Dependencies are inferred from the claim text.