Bipolar breakdown enhancement circuit for tri-state output stage
AssigneeAnalog Devices, Inc.
InventorEric Braun
Life of this patent
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Abstract
A bipolar transistor breakdown voltage enhancement circuit extends the voltage swing which can be tolerated at an output terminal driven by an emitter follower-connected bipolar output transistor operating in a high impedance state. The enhancement circuit connects the base of the output transistor to a voltage which extends the allowable high impedance output voltage swing: an NPN output transistor's base is tied to a voltage that is the lower of the output voltage or ground, and a PNP output transistor's base is tied to a voltage which is the higher of the output voltage or VDD.
Claims17
A bipolar breakdown enhancement circuit for use with a tri-state output stage, comprising:
- a supply voltage,
- a ground terminal which is at a ground potential,
- an NPN emitter follower-connected bipolar output transistor, the collector-emitter circuit of said output transistor connected between said supply voltage and an output terminal, said transistor arranged to produce an output voltage at said output terminal which is referenced to said ground potential,
- a comparison circuit which produces an output equal to the lesser of said output voltage and said ground potential, wherein said comparison circuit comprises first and second FETs, said first FET connected between said ground terminal and a common node and arranged to conduct a first current to said common node in response to said output voltage and said second FET connected between said output terminal and said common node and arranged to conduct a second current to said common node in response to said ground potential, said common node being the output of said comparison circuit, and
- a switch arranged to connect the base of said output transistor to the output of said comparison circuit in response to a tri-state control signal which is asserted when said output transistor is to be placed in a high-impedance state.
A bipolar breakdown enhancement circuit for use with a tri-state output stage, comprising:
- supply voltage,
- a ground terminal which is at a ground potential,
- a PNP emitter follower-connected bipolar output transistor, the collector-emitter circuit of said output transistor connected between said ground terminal and an output terminal, said transistor arranged to produce an output voltage at said output terminal which is referenced to said ground potential,
- a comparison circuit which produces an output equal to the greater of said output voltage and said supply voltage, wherein said comparison circuit comprises first and second FETs, said first FET connected between said supply voltage and a common node and arranged to conduct a first current to said common node in response to said output voltage and said second FET connected between said output terminal and said common node and arranged to conduct a second current to said common node in response to said supply voltage, said common node being the output of said comparison circuit, and
- a switch arranged to connect the base of said output transistor to the output of said comparison circuit in response to a tri-state control signal which is asserted when said output transistor is to be placed in a high-impedance state.
A bipolar breakdown enhancement circuit for use with a tri-state output stage, comprising:
- a first supply voltage VDD,
- a second supply voltage VEE,
- a ground terminal which is at a ground potential GND,
- an NPN emitter follower-connected bipolar output transistor, the collector-emitter circuit of said NPN output transistor connected between VDD and an output terminal,
- a PNP emitter follower-connected bipolar output transistor, the collector-emitter circuit of said PNP output transistor connected between VEE and said output terminal, said output/transistors arranged to produce an output voltage at said output terminal which is referenced to said ground potential,
- a first comparison circuit connected to said output voltage and said ground potential at respective inputs and which produces an output equal to the lesser of said output voltage and said ground potential,
- a second comparison circuit connected to said output voltage and said supply voltage at respective inputs and which produces an output equal to the greater of said output voltage and said supply voltage,
- a first switch arranged to connect the base of said NPN output transistor to the output of said first comparison circuit in response to a first tri-state control signal which is asserted when said NPN output transistor is to be placed in a high-impedance state, and
- a second switch arranged to connect the base of said PNP output transistor to the output of said second comparison circuit in response to a second tri-state control signal which is asserted when said PNP output transistor is to be placed in a high-impedance state.
A bipolar breakdown enhancement circuit for use with a tri-state output stage, comprising:
- a first supply voltage VDD,
- a second supply voltage VEE,
- a ground terminal which is at a ground potential GND,
- an NPN emitter follower-connected bipolar output transistor, the collector-emitter circuit of said NPN output transistor connected between VDD and an output terminal,
- a PNP emitter follower-connected bipolar output transistor, the collector-emitter circuit of said PNP output transistor connected between VEE and said output terminal, said output transistors arranged to produce an output voltage at said output terminal which is referenced to said ground potential,
- a first comparison circuit which produces an output equal to the lesser of said output voltage and said ground potential, said first comparison circuit comprising first and second FETs, said first FET connected between said ground terminal and a first common node and arranged to conduct a current to said first common node in response to said output voltage and said second FET connected between said output terminal and said first common node and arranged to conduct a current to said first common node in response to said ground potential, said first common node being the output of said first comparison circuit,
- a second comparison circuit which produces an output equal to the greater of said output voltage and said supply voltage, said second comparison circuit comprising third and fourth FETs, said third FET connected between said supply voltage and a second common node and arranged to conduct a current to said second common node in response to said output voltage and said fourth FET connected between said output terminal and said second common node and arranged to conduct a current to said second common node in response to said supply voltage, said second common node being the output of said second comparison circuit,
- a fifth FET arranged to connect the base of said NPN output transistor to the output of said first comparison circuit in response to a tri-state control signal which is asserted when said NPN output transistor is to be placed in a high-impedance state, and
- a sixth FET arranged to connect the base of said PNP output transistor to the output of said second comparison circuit in response to a tri-state control signal which is asserted when said PNP output transistor is to be placed in a high-impedance state,
- wherein said NPN output transistor has a shorted base breakdown voltage parameter BVecsNPN and said PNP output transistor has a shorted base breakdown voltage parameter BVecsPNP, and the allowable output swing at said output terminal when said output transistors are in their high-impedance states is given by:
- (−BVecsPNP+GND) to (+BVecsNPN+VDD).
Dependencies are inferred from the claim text.