Data head writer coil testing
AssigneeSeagate Technology LLC
InventorsBeng Theam Ko, Eng Hock Lim, Myint Ngwe, Kah Liang Gan, Beng Wee Quak
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Abstract
A writer coil in a data head of a data storage system is tested by coupling detection circuitry to the writer coil and driving the writer coil with a periodic pulse signal generated by the detection circuitry. As a result, voltage is generated, with the detection circuitry, as a function of an inductance of the writer coil. An inductance of the writer coil is calculated as a function of the generated voltage. Electrical short circuits and discontinuities in the writer coil are identified as a function of the calculated inductance.
Claims14
A method of testing a writer coil in a data head of a data storage system, the method comprising the steps of:
- (A) coupling detection circuitry to the writer coil and driving the writer coil with a periodic pulse signal generated by the detection circuitry;
- (B) generating a ladder voltage signal, with the detection circuitry, as a function of an inductance of the writer coil and in response to the periodic pulse signal;
- (C) calculating an inductance of the writer coil as a function of the generated ladder voltage signal;
- and
- (D) identifying electrical short circuits and discontinuities in the writer coil as a function of the calculated inductance.
A data storage system comprising:
- a data head having a writer coil embedded therein;
- and
- detection circuitry operably coupled to the writer coil and configured to calculate an inductance of the writer coil, wherein the detection circuitry comprises a ladder circuit operably coupled to the writer coil and configured to drive the writer coil with a periodic pulse signal and to generate a ladder output signal as a function of the inductance of the writer coil and in response to the periodic pulse signal.
Dependencies are inferred from the claim text.