Flat panel image sensor
AssigneeSharp Kabushiki Kaisha
InventorYoshihiro Izumi
Life of this patent
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Abstract
In the present invention, the thickness of an insulating resin 6, in an area Y1 of an active matrix substrate 2 on which a semiconductor film 3 is formed, is equal to the thickness in an area X1 of the active matrix substrate 2 on which the semiconductor film 3 is not formed. On this account, in a flat panel image sensor 1, stress generated inside the insulating resin 6 is reduced, warpage of the active matrix substrate 2 is prevented in advance, and impact resistance of the flat panel image sensor 1 is improved.
Claims16
A flat panel image sensor, comprising:
- an active matrix substrate;
- a semiconductor film formed on the active matrix substrate;
- a bias electrode formed on the semiconductor film;
- a first spacer formed on the active matrix substrate so as to surround the semiconductor film;
- an insulating resin formed on surfaces of the semiconductor film, the bias electrode, and the active matrix substrate, and sealed by the first spacer;
- and
- a protective substrate facing the active matrix substrate via the first spacer and covering the insulating film,
- wherein the insulating resin formed on the semiconductor film is as thick as the insulating resin formed on a peripheral part of the active matrix substrate, in which part neither the semiconductor film nor the first spacer is formed.
A flat panel image sensor, comprising:
- an active matrix substrate;
- a semiconductor film formed on the active matrix substrate;
- a bias electrode formed on the semiconductor film;
- a spacer formed on the active matrix substrate so as to surround the semiconductor film;
- an insulating resin formed on the semiconductor film and sealed by the spacer;
- and
- a protective substrate facing the active matrix substrate via the spacer and covering the insulating film,
- wherein the spacer is formed to cover a whole part of the active matrix substrate, in which part the semiconductor film is not formed, and also is formed to be thicker than the semiconductor film.
A flat panel image sensor, comprising:
- an active matrix substrate;
- a semiconductor film formed on the active matrix substrate;
- a bias electrode formed on the semiconductor film;
- a first spacer formed on the active matrix substrate so as to surround the semiconductor film without touching the film;
- an insulating resin formed on surfaces of the semiconductor film, the bias electrode, and the active matrix substrate, and sealed by the first spacer;
- and
- a protective substrate facing the active matrix substrate via the first spacer and covering the insulating film,
- wherein a second spacer is formed on a whole part of the active matrix substrate, in which part neither the semiconductor film nor the first spacer is formed.
A flat panel image sensor, comprising:
- an active matrix substrate;
- a semiconductor film formed on the active matrix substrate;
- a bias electrode formed on the semiconductor film;
- a first spacer formed on the active matrix substrate so as to surround the semiconductor film without touching the film;
- an insulating resin formed on surfaces of the semiconductor film, the bias electrode, and the active matrix substrate, and sealed by the first spacer;
- and
- a protective substrate facing the active matrix substrate via the first spacer and also covering the insulating film,
- wherein a pit part is formed in a whole part of the protective substrate, in which part the protective substrate faces the semiconductor film.
A flat panel image sensor, comprising:
- an active matrix substrate;
- a semiconductor film formed on the active matrix substrate;
- a first spacer formed on the active matrix substrate so as to surround the semiconductor film;
- and
- an insulating resin formed on surfaces of the semiconductor film and the active matrix substrate, and sealed by the first spacer,
- wherein the insulating resin formed on the semiconductor film is as thick as the insulating resin formed on a peripheral part of the active matrix substrate, in which area neither the semiconductor film nor the first spacer is formed.
A flat panel image sensor, comprising:
- an active matrix substrate;
- a semiconductor film formed on the active matrix substrate;
- a spacer formed on the active matrix substrate so as to surround the semiconductor film;
- and
- an insulating resin formed on a surface of the semiconductor film, and sealed by the spacer,
- wherein the spacer covers a whole part of the active matrix substrate, in which part the semiconductor film is not formed, and also is formed to be thicker than the semiconductor film.
A flat panel image sensor, comprising:
- an active matrix substrate;
- a semiconductor film formed on the active matrix substrate;
- and
- a first spacer formed on the active matrix substrate so as to surround the semiconductor film without touching the film;
- wherein a second spacer is formed on a whole part of the active matrix substrate, in which part neither the semiconductor film nor the first spacer is formed.
A flat panel image sensor, comprising:
- an active matrix substrate;
- a semiconductor film formed on the active matrix substrate;
- and
- a protective substrate provided to face the active matrix substrate,
- wherein a pit part is formed in a whole part of the protective substrate, in which part the protective substrate faces the semiconductor film.
Dependencies are inferred from the claim text.