Preparation of composite high-K/standard-K dielectrics for semiconductor devices
AssigneeAdvanced Micro Devices, Inc.
InventorsArvind Halliyal, Joong S. Jeon, Minh Van Ngo, Robert B. Ogle
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AssigneeAdvanced Micro Devices, Inc.
InventorsArvind Halliyal, Joong S. Jeon, Minh Van Ngo, Robert B. Ogle
Estimating the term…
A semiconductor device and a method of fabricating the semiconductor device having a composite dielectric layer including steps of providing a semiconductor substrate; depositing on the semiconductor substrate alternating sub-layers of a first dielectric material and a second dielectric material to form a layered dielectric structure having at least two sub-layers of at least one of the first dielectric material and the second dielectric material, in which one of the first dielectric material and the second dielectric material is a high-K dielectric material and an other of the first dielectric material and the second dielectric material is a standard-K dielectric material comprising aluminum oxide; and annealing the layered dielectric structure at an elevated temperature to form a composite dielectric layer.
A method of fabricating a semiconductor device having a composite dielectric layer, comprising:
A method of fabricating a semiconductor device having a composite dielectric layer, comprising:
A method of fabricating a semiconductor device having a composite dielectric layer, comprising:
Dependencies are inferred from the claim text.