US 6,643,944 B2Granted

Touch signal probe and signal processing apparatus and signal processing method of the same

AssigneeMitutoyo Corporation

InventorsYukiji Yoda, Tomoyuki Miyazaki, Yutaka Nishitsuji, Yoshikazu Kobayashi, Keiji Akagi

Life of this patent

Estimating the term…

Loading patent…

Abstract

A touch signal probe comprises a fixed member, a movable member, a bias means, a drive member, a deformation touch signal processing circuit, a contact touch signal processing circuit, and a latch circuit. A stylus is attached to the movable member. The drive member relatively drives reseat position elements respectively placed on the fixed member and the movable member. The bias means restores the movable member to a still position. The deformation touch signal processing circuit generates a deformation touch signal. The contact touch signal processing circuit uses the reseat position elements as make-and-break electric contacts to generate a contact touch signal. The latch circuit inputs coordinate values every instant at which the deformation touch signal is output and stores the coordinate values as the most recent coordinate values for update, and when the contact touch signal is output, outputs the most recent coordinate values as detected coordinate values.

Claims19

Dependent claims

A signal processing apparatus of a touch signal probe used for a machine capable of measuring coordinate values of the touch signal probe, the touch signal probe having a fixed member, a movable member to which a stylus comprising a contact element and a deformation detection element is attached, a fixed member side reseat position element being placed on the fixed member, a movable member side reseat position element being placed on the movable member for coming in contact with the fixed member side reseat position element, and a bias member for allowing displacement of the movable member relative to the fixed member when an external force acts on the stylus and restoring the movable member to a still position by a bias force when the external force acting on the stylus disappears, said signal processing apparatus comprising:

a drive circuit for outputting a drive signal for causing the movable member side reseat position element to make a relative move to the fixed member side reseat position element;
a deformation touch signal processing circuit for generating a deformation touch signal from the deformation detection element;
a contact touch signal processing circuit using the fixed member side and movable member side reseat position elements as make-and-break electric contacts to generate a contact touch signal from the make-and-break electric contacts;
and
a latch circuit for inputting the coordinate values every instant at which the deformation touch signal is output and storing the coordinate values as the most recent coordinate values for update and when the contact touch signal is output, outputting the most recent coordinate values as detected coordinate values.

2 more elements

A touch signal probe comprising:

a fixed member;
a movable member to which a stylus comprising a contact element and a deformation detection element is attached;
a fixed member side reseat position element being placed on the fixed member;
a movable member side reseat position element being placed on the movable member for coming in contact with the fixed member side reseat position element;
A bias member for allowing displacement of the movable member relative to the fixed member when an external force acts on the stylus and restoring the movable member to a still position by a bias force when the external force acting on the stylus disappears:
a drive member for causing the movable member side reseat position element to make a relative move to the fixed member side reseat position element;
a deformation touch signal processing circuit for generating a deformation touch signal from the deformation detection element;
a contact touch signal processing circuit using the fixed member side and movable member side reseat position elements as make-and-break electric contacts to generate a contact touch signal from the make-and-break electric contacts;
and
a signal processing unit having a latch circuit for inputting coordinate values of the touch signal probe every instant at which the deformation touch signal is output and storing the coordinate values as the most recent coordinate values for update and when the contact touch signal is output, outputting the most recent coordinate values as detected coordinate values.

7 more elements

A signal processing method of a touch signal probe for use with a machine capable of measuring coordinate values of said touch signal probe, the touch signal probe having a fixed member, a movable member to which a stylus comprising a contact element and a deformation detection element is attached, a fixed member side reseat position element being placed on the fixed member, and a movable member side reseat position element being placed on the movable member for coming in contact with the fixed member side reseat position element, a drive member for causing the movable member side reseat position element to make a relative move to the fixed member side reseat position element, an bias member for allowing displacement of the movable member relative to the fixed member when an external force acts on the stylus and restoring the movable member to a still position by a bias force when the external force acting on the stylus disappears, a deformation touch signal processing circuit including an operation circuit for enabling an operation condition to be switched, for generating a deformation touch signal from the deformation detection element, and a contact touch signal processing circuit using the fixed member side and movable member side reseat position elements as make-and-break electric contacts to generate a contact touch signal from the make-and-break electric contacts, said signal processing method comprising:

positioning the touch signal probe before a measurement point of a work;
driving the drive member for making a reseat position correction;
switching the operation condition of the operational circuit for enhancing sensitivity;
feeding the touch signal probe into the measurement point for measuring;
when the deformation touch signal is input, inputting the coordinate values and storing the coordinate values as the most recent coordinate values for update;
when the contact touch signal is input, outputting the most recent coordinate values as detected coordinate values;
and
switching the operation condition of the operational circuit for lowering the sensitivity.

5 more elements

Dependencies are inferred from the claim text.