Device testing contactor, method of producing the same, and device testing carrier
AssigneeFujitsu Limited
InventorsMakoto Haseyama, Shigeyuki Maruyama
Life of this patent
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Abstract
A contactor used for testing a semiconductor device is provided. The semiconductor device testing contactor is electrically connected to electrodes of a semiconductor device to be tested. Such a contactor includes a wiring board and a first reinforcing member for reinforcing the wiring board. The contactor has a flexible base film and device connecting pads to be electrically connected to the electrodes of the semiconductor device. The first reinforcing member is disposed on the surface opposite to the semiconductor device connecting surface of the wiring board. The wiring board and the first reinforcing member are collectively bonded.
Claims7
A method of producing a device testing contactor comprising the steps of:
- mounting a wiring board to a metal mold made up of an upper mold and a lower mold provided with a lower cavity having a shape corresponding to a shape of a first reinforcing member;
- and
- forming the first reinforcing member by injecting a reinforcing material into the metal mold, so that the wiring board and the first reinforcing member are collectively bonded.
Dependencies are inferred from the claim text.