Monitoring system and method implementing automatic testing with a smart scanning algorithm
AssigneeAgilent Technologies, Inc.
InventorsCraig Chamberlain, Eric N. Flink, Bill Morgan
Life of this patent
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AssigneeAgilent Technologies, Inc.
InventorsCraig Chamberlain, Eric N. Flink, Bill Morgan
Estimating the term…
A channel plan and a corresponding test plan are implemented in connection with a plurality of nodes that communicate signals. The channel plan enables a monitoring system to conduct automatic periodic test plans, comprising tests, on the nodes, based upon data specified in the channel plan. Each test plan prescribes measurement of at least one signal parameter, pertaining to one or more nodes and/or one or more channels communicated across the nodes. The monitoring system includes a spectrum analyzer, a switch enabling the spectrum analyzer to interface with the nodes, and a controller. The controller causes periodic automatic testing of the signal characteristics of the nodes based upon the test plan and a smart scanning algorithm.
A system for enabling efficient monitoring of electrical signals, comprising:
A computer readable medium having a program, the program comprising:
A method for enabling efficient monitoring of electrical signals communicated along connections, comprising:
A method for enabling efficient monitoring of electrical signals communicated along nodes, comprising:
Dependencies are inferred from the claim text.