High-voltage detection circuit for a semiconductor memory
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorMasaaki Mihara
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Abstract
In a high-voltage detection circuit (10) for detecting a high voltage (VP) output from a high-voltage generation circuit (14), an output of the high-voltage generation circuit is dropped in voltage by a high-voltage drop circuit (13) to output a dropped voltage (VO), a reference-voltage generation circuit (11) generates a reference voltage (Vref) of a comparatively-high potential using the the high voltage (VP) as its power source, and a comparison circuit (12) compares the dropped voltage (VO) with the reference voltage (Vref) to control a high-voltage level.
Claims10
A high-voltage detection circuit which detects a high voltage output from a high-voltage generation circuit in a semiconductor memory, the high-voltage detection circuit comprising:
- a high-voltage drop circuit which drops the high voltage output of the high-voltage generation circuit and generates a dropped voltage;
- a reference voltage generation circuit which receives the high voltage output of the high-voltage generation circuit to be used as an input voltage source and generates a reference voltage;
- and
- a comparison circuit which compares the dropped voltage output of the high-voltage drop circuit with the reference voltage output of the reference-voltage generation circuit and thereby controls the high-voltage generation circuit to generate an adjusted high voltage.
Dependencies are inferred from the claim text.