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US 6,643,161 B2Granted
Write-once polymer memory with e-beam writing and reading
AssigneeIntel Corporation
InventorsEric C. Hannah, Michael A. Brown
Life of this patent
Estimating the term…
Abstract
Storing a data bit includes exposing a volume of a polymer, having a first conductivity, to an electron beam. Exposing damages cross-links in the volume of material. A first conductivity of the polymer is changed to a second conductivity and the data is stored in the bit.
Claims15
A method to read a bit of data, comprising:
- exposing a layer of material, having a first side and a second side, to an electron beam having a first energy level, the layer of material having a first conductor coupled with the first side and a second conductor coupled with the second side;
- inducing a first current in the first conductor and a second current in the second conductor during said exposing;
- relating the first current and the second current to memory states of the bit of data;
- and
- wherein the layer of material is a polymer.
2 more elements
A method to read a bit of data, comprising:
- exposing a first layer of polymer, having a first side and a second side, to an electron beam having a first energy level, the first layer of polymer having a first conductor coupled with the first side and a second layer of polymer coupled with the second side and a second conductor coupled with the second layer of polymer;
- inducing a first current in the first conductor and a second current in the second conductor during said exposing;
- and
- relating the first current and the second current to memory states of the bit of data.
1 more element
An apparatus to read a bit of data, comprising:
- a first volume of polymer having a first side and a second side;
- a first conductive material disposed on said first side;
- a second volume of polymer disposed on said second side, wherein a conductivity of said second volume of polymer remaining substantially constant;
- a second conductive material disposed on said second volume of polymer;
- and
- an electron beam source, to cause an electron beam incident on said first volume of polymer, wherein an electron beam current distribution to be measured differentially between said first conductor and said second conductor reads the bit of data.
3 more elements
Dependencies are inferred from the claim text.