Method for controlling optical property measurement system
AssigneeMatsushita Electric Industrial Co., Ltd.
InventorTatsurou Kawamura
Life of this patent
Estimating the term…
Loading patent…
AssigneeMatsushita Electric Industrial Co., Ltd.
InventorTatsurou Kawamura
Estimating the term…
The present invention provides a controlling method of optical property measurement system wherein optical properties of a liquid sample are measured by projecting first light to analyze transmitted light, the method comprising the steps of projecting additional light to a path of the first light or in a periphery thereof to detect the presence or absence of bubbles and/or particles which may interfere with transmission of the first light, based on an intensity of transmitted light of the second light, and removing the bubbles and/or particles when their presence is confirmed. This eliminates the need of detaching the sample cell from an optical system to introduce or excrete the sample and facilitates precise measurement of optical properties of sample even when interfering substances are present in the sample cell.
A method for controlling an optical property measurement system wherein optical properties of a liquid sample accommodated in a sample cell are measured by projecting a first light to the liquid sample to analyze light transmitted through the liquid sample, the method comprising the steps of:
A method for controlling an optical property measurement system wherein optical properties of a liquid sample accommodated in a sample cell are measured by projecting a first light to the liquid sample to analyze light transmitted through the liquid sample, the method comprising the steps of:
Dependencies are inferred from the claim text.