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US 6,643,012 B2Granted
Apertureless near-field scanning raman microscopy using reflection scattering geometry
AssigneeNational University of Singapore
InventorsZe Xiang Shen, Wanxin Sun
Life of this patent
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Abstract
An apertureless near-field scanning Raman microscope using reflection geometry. A laser beam focused to a small spot size on a sample onto which a silver coated metal probe is positioned. With this arrangement, it is possible to obtain enhanced near-field spectroscopy using reflection geometry. Near-field spectroscopic mapping can be done in a short time without extensive sample preparation.
Claims18
A Raman spectrographic system, comprising:
- a stage for receiving a sample to be measured;
- a lens for focusing a laser beam to a small spot size on said sample;
- an apertureless metal tip at least close to said sample within said laser spot;
- said lens collecting Raman scattered light in reflection geometry;
- and
- a Raman spectrometer for receiving said collected light and analyzing said sample.
3 more elements
A near-field scanning Raman spectrometer, comprising:
- a stage for receiving a sample to be measured;
- an apertureless metal tip at least close to said sample;
- a light beam focused to a small spot by a first lens on the metal tip and said sample;
- said metal tip enhancing a near-field Raman signal;
- a second lens for collecting Raman shifted light in reflection geometry;
- and
- a Raman spectrometer for receiving said collected light and analyzing said sample.
4 more elements
A method of performing apertureless near-field scanning Raman microscopy in reflection geometry, comprising:
- focusing a laser beam onto a small spot on a surface of a sample;
- placing a metal tip at least close to said surface at a location within said spot;
- collecting Raman shifted light in reflection geometry;
- and
- applying said collected light to a Raman spectrometer to analyze said sample.
2 more elements
Dependencies are inferred from the claim text.