Apparatus for indentifying defects in electronic assemblies

An electronic apparatus for identifying defects in identical electronic assemblies situated therein, the electronic apparatus comprising:

• a first assembly;
• a second assembly which is identical to the first assembly;
• a bidirectional line which connects the first assembly to the second assembly and which is coupled to a voltage source;
• a first scan register operating as a first test data output register as part of the first assembly;
• a second scan register operating as a second test data output register as part of the second assembly;
• a first line driver as part of the first assembly, the first line driver being connected to the bidirectional line via a first interface, the first line driver designed such that, in response to a first signal generated by the first test data output register, the bidirectional line is one of connected to ground and isolated therefrom;
• a second line driver as part of the second assembly, the second line driver connected to the bidirectional line via a second interface, the second line driver being designed such that, in response to a second signal generated by the second test data output register, the bidirectional line is one of connected to ground and isolated therefrom;
• a first line receiver as part of the first assembly, the first line receiver being connected to the bidirectional line via the first interface;
• a second line receiver as part of the second assembly, the second line receiver being connected to the bidirectional line via the second interface;
• a first evaluation device as part of the first assembly;
• and
• a second evaluation device as part of the second assembly, wherein the first and second evaluation devices are designed such that a lack of correspondence between the first and second signals of the first and second test data output registers is detected.