Probe card for tester head

A probe card for a tester head in a testing apparatus including a supporting plate on which a semiconductor wafer may be positioned and the tester head installed a predetermined distance away from the supporting plate and having a top plate, and which tests the electrical parameters of one or more chips formed on the semiconductor wafer, the probe card comprising:

• a printed circuit board connected to the top plate, wherein the printed circuit board is a circular plate having a central point at the center thereof, a diameter of no less than 400 mm (15.75 inches), and is partitioned into four quadrants;
• a plurality of connecting elements each having a plurality of contact pins formed on the printed circuit board such that generally one fourth of the plurality of connecting elements are allotted to each one of the four quadrants, and such that the center of each of the plurality of connecting elements is 191.5 mm (7.54 inches) away from the central point of the printed circuit board, wherein two adjacent connecting elements belonging to the same quadrant of the printed circuit board among the plurality of connecting elements form an angle of 3.5 degrees with each other;
• and
• a probe unit connected to the printed circuit board.