Capacitor-type semiconductor device
AssigneeRohm Co., Ltd.
InventorHiroshi Hayashizaki
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AssigneeRohm Co., Ltd.
InventorHiroshi Hayashizaki
Estimating the term…
It is an object of the present invention to provide a semiconductor device capable of decreasing electric resistance of a lower electrode provided therein, as well as capable of accurately responding to external signals having high frequencies inputted therein. The lower electrode 7 consists of three layers such as a silicon lower electrode layer 7a made of poly-crystalline silicon, a tungsten-silicide layer 7b made of tungsten silicide as a chemical compound of tungsten and silicon, and a protection layer 7c made of poly-crystalline silicon. By constructing the semiconductor device as described above, oxidation of the tungsten-silicide layer 7b may be prevented by the protection layer 7c made of poly-crystalline silicon even when oxidation layers of an ONO (silicon oxidation) layer 11 is formed by thermal oxidation. Consequently, electric resistance of the lower electrode 7 can be decreased.
A capacitor-type semiconductor device comprising:
A capacitor-type semiconductor device comprising of:
A capacitor-type semiconductor device comprising:
A capacitor-type semiconductor device comprising:
Dependencies are inferred from the claim text.