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US 6,641,430 B2Granted
Contact structure and production method thereof and probe contact assembly using same
AssigneeAdvantest Corporation
InventorsYu Zhou, David Yu, Robert Edward Aldaz, Theodore A. Khoury
Life of this patent
Estimating the term…
Abstract
A contact structure for establishing electrical connection with contact targets. The contact structure is formed of a contactor carrier and a plurality of contactors attached to a contactor adapter. The contactor adapter is inserted in a slot of the contactor carrier, thereby locking the contactors on the contactor carrier. The contactor has an upper end having a cut-out to engage fit in contactor adapter, a lower end oriented in a direction opposite to the upper end and functions as a contact point for electrical connection with a contact target, and a diagonal portion provided between the upper end and the lower end to function as a spring.
Claims18
A contact structure for establishing electrical connection with contact targets, comprising:
- a plurality of contactors made of conductive material where each of the contactors is comprised of an upper end oriented in a vertical direction and has a cut-out for achieving a lock mechanism, a lower end oriented in a direction opposite to the upper end and functions as a contact point for electrical connection with a contact target, and a diagonal portion provided between the upper end and the lower end to function as a spring;
- a contactor adapter having a plurality of grooves running in a direction vertical with a surface thereof for mounting the contactors on the contactor adapter;
- and
- a contactor carrier having a slot for mounting the plurality of contactors when the contactor adapter having the contactors is inserted therein;
- wherein said cut-out creates a recess on the contactor with a length equal to a thickness of said contactor adapter so that an inner wall of the groove of the contactor adapter fits in said cut-out, and wherein said upper end of each contactor is projected from said upper surface of said contactor carrier and said lower end of each contactor is projected from said lower surface of said contactor carrier.
2 more elements
A method for producing a contact structure, comprising the following steps of:
- (a) forming a sacrificial layer on a surface of a base substrate;
- (b) forming a photoresist layer on the sacrificial layer;
- (c) aligning a photo mask over the photoresist layer and exposing the photoresist layer through the photo mask, the photo mask including an image of the contactors;
- (d) developing patterns of the image of the contactors on a surface of the photoresist layer;
- (e) forming the contactors made of conductive material in the patterns on the photoresist layer by depositing the conductive material, each of the contactors having an upper end with a cut-out for achieving a lock mechanism, a lower end oriented in a direction opposite to the upper end to function as a contact point, and a diagonal beam portion provided between the upper end and the lower end to function as a spring;
- (f) stripping the photoresist layer off;
- (g) removing the sacrificial layer so that the contactors are separated from the base substrate;
- (h) attaching the contactors to a contactor adapter having grooves thereon wherein said cut-out creates a recess on the contactor with a length equal to a thickness of said contactor adapter so that an inner wall of the groove of the contactor adapter fits in said cut-out;
- and
- (i) mounting the contactor adapter having the contactors on a contactor carrier by inserting the contactor adapter in a slot on the contactor carrier, thereby forming the lock mechanism.
7 more elements
A method for producing a contact structure, comprising the following steps of:
- (a) forming an conductive substrate made of electric conductive material on a base substrate;
- (b) forming a photoresist layer on the conductive substrate;
- (c) aligning a photo mask over the photoresist layer and exposing the photoresist layer through the photo mask, the photo mask including an image of the contactors;
- (d) developing patterns of the image of the contactors on a surface of the photoresist layer;
- (e) forming the contactors made of conductive material in the patterns on the photoresist layer by depositing the conductive material, wherein each of the contactors having an upper end with a cut-out for achieving a lock mechanism, a lower end oriented in a direction opposite to the upper end to function as a contact point, and a diagonal beam portion provided between the upper end and the lower end to function as a spring;
- (f) stripping off the photoresist layer;
- (g) peeling the conductive substrate having contactors thereon from the base substrate;
- (h) placing an adhesive tape on the contactors on the conductive substrate so that upper surfaces of the contactors adhere to the adhesive tape wherein adhesive strength between the contactors and the adhesive tape is larger than that between the contactors and the conductive substrate;
- (i) peeling the conductive substrate so that the contactors on the adhesive tape are separated from the conductive substrate;
- (j) attaching the contactors to a contactor adapter having grooves thereon wherein said cut-out creates a recess on the contactor with a length equal to a thickness of said contactor adapter so that an inner wall of the groove of the contactor adapter fits in said cut-out;
- and
- (k) mounting the contactor adapter having the contactors on a contactor carrier by inserting the contactor adapter in a slot on the contactor carrier, thereby forming the lock mechanism.
9 more elements
A probe contact assembly for establishing electrical connection with contact targets, comprising:
- a contactor carrier having a contactor adapter inserted in a slot where a plurality of contactors are mounted on the contactor adapter;
- a probe card for mounting the contactor carrier and establishing electrical communication between the contactors and electrodes provided on the probe card;
- and
- a pin block having a plurality of contact pins to interface between the probe card and a semiconductor test system when the pin block is attached to the probe card;
- wherein each of the contactors is comprised of an upper end oriented in a vertical direction and has the cut-out for being fitted in the groove on the contactor adapter, a lower end oriented in a direction opposite to the upper end and functions as a contact point for electrical connection with a contact target, and a diagonal portion provided between the upper end and the lower end to function as a spring and
- wherein said cut-out creates a recess on the contactor with a length equal to a thickness of said contactor adapter so that an inner wall of the groove of the contactor adapter fits in said cut-out.
3 more elements
Dependencies are inferred from the claim text.