Time domain reflectometry measurement instrument
AssigneeMagnetrol International, Incorporated
InventorsBoyce Carsella, Leo Klinstein
Life of this patent
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Abstract
A time domain reflectometry measuring instrument uses a microprocessor that provides added functionality and capabilities. The circuit electronics and probe are tested and calibrated at the factory. Installation and commissioning by the user is simple. The user installs the probe. The transmitter is attached to the probe. The user connects a standard shielded twisted pair to the electronics. Power is applied and the device immediately displays levels. A few-simple parameters may need to be entered such as output characteristics and the process material dielectric constant.
Claims13
A time domain reflectometry measurement instrument comprising:
- a probe defining a transmission line;
- a pulse circuit connected to the probe for generating pulses on the transmission line and receiving reflected pulses returned on the transmission line, the reflected pulses representing a characteristic of a material being measured;
- an equivalent time sampling circuit connected to the pulse circuit for developing an equivalent time representation of the reflected pulses over an expanded time scale during a region of interest;
- and
- an automatic scale circuit operatively associated with the sampling circuit for automatically selecting location and size of the region of interest corresponding to characteristics of the probe.
Dependencies are inferred from the claim text.