System and method for setup and hold characterization in integrated circuit cells

Abstract

An invention is disclosed for setup and hold time characterization in an integrated circuit cell. A setup time is obtained for a first constraint pin. A setup time is also calculated for a test point defined in the integrated circuit cell using the setup time for the first constraint pin and a first propagation delay from the first constraint pin to the test point. A setup time for a second constraint pin is determined based on the setup time for the test point and a second propagation delay from the second constraint pin to the test point. In addition to the setup time, a hold time can be obtained for the first constraint pin, and a hold time for the test point can be calculated using the hold time for the first constraint pin and the first propagation delay. Further, a hold time for the second constraint pin can be determined based on the hold time for the test point and the second propagation delay.

Dependencies are inferred from the claim text.