Semiconductor integrated circuit device having link element
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorsAkira Imamura, Yasuhiro Mabuchi, Toshiaki Koyama
Life of this patent
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Abstract
A semiconductor integrated circuit device has a first LT fuse group for storing replacement information used in a memory array; a second LT fuse group for storing confirmation information to confirm whether the first LT fuse group has accurately stored the replacement information; and an input/output port for outputting information PI actually stored in the first LT fuse group and information CI actually stored in the second LT fuse group to an external memory tester. The first and second LT fuse groups are fabricated according to the same conditions, and the laser input to the respective group is set to be under the same conditions.
Claims12
A semiconductor integrated circuit device, comprising:
- an internal circuit performing a prescribed operation;
- a plurality of first link elements storing in a non-volatile manner first information used in said internal circuit in response to an external program input;
- a confirmation information storing portion storing in a non-volatile manner second information for confirming whether said plurality of first link elements have accurately stored said first information;
- an input/output port externally outputting information stored by said plurality of first link elements and information stored by said confirmation information storing portion in an operation test;
- and wherein
- said confirmation information storing portion includes a plurality of second link elements, each of which is manufactured under same conditions as each of said first link elements;
- and
- each of said second link elements receives a program input of the same conditions as each of said first link elements and stores said second information.
A semiconductor integrated circuit device, comprising:
- an internal circuit performing a prescribed operation;
- a plurality of first link elements storing in a non-volatile manner first information used in said internal circuit in response to an external program input;
- a confirmation information storing portion storing in a non-volatile manner second information for confirming whether said plurality of first link elements have accurately stored said first information;
- and
- an arithmetic circuit externally outputting a determination result based on information stored by said plurality of first link elements and information stored by said confirmation information storing portion in an operation test;
- and wherein
- said confirmation information storing portion includes a plurality of second link elements, each of which is manufactured under same conditions as each of said first link elements;
- and
- each of said second link elements receives a program input of the same conditions as each of said first link elements and stores said second information.
Dependencies are inferred from the claim text.