Defect avoidance in an integrated circuit
AssigneeNokia Mobile Phones Ltd.
InventorTapio Kuiri
Life of this patent
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Abstract
A method of using an integrated circuit with at least one defect, said method comprising the steps of determining the location of one or more defects in said integrated circuit; selecting a program to be stored on said integrated circuit, said program being selected on the basis of the location of said one or more defects; and loading said program onto said integrated circuit.
Claims16
A method of using an integrated circuit with at least one defect, said method comprising the steps of:
- determining the location of one or more defects in said integrated circuit;
- selecting a program to be stored on said integrated circuit, said program being selected on the basis of the location of said one or more defects;
- and
- loading said program onto said integrated circuit.
A method of producing an integrated circuit, said method comprising the steps of:
- dividing at least part of said integrated circuit into a plurality of notional blocks;
- determining the number of blocks containing one or more defects;
- and
- if the number of blocks containing one or more defects is greater than a threshold, discarding said integrated circuit.
A method of using an integrated circuit with at least one defective part, said defective part being present upon completion of manufacture of the integrated circuit, the method comprising the steps of:
- determining the location of each of said at least one defective part in said integrated circuit;
- selecting a program to be stored on said integrated circuit, said program being based on the location of each defective part for enabling utilization of said integrated circuit with avoidance of each defective part;
- and
- loading said program onto said integrated circuit.
A method of using an integrated circuit with at least one defective part, said defective part being present upon completion of manufacture of the integrated circuit, the method comprising the steps of:
- determining the location of each of said at least one defective part in said integrated circuit;
- selecting a program to be stored on said integrated circuit, said program being based on the location of each defective part for enabling utilization of said integrated circuit with utilization of each defective part in a modified mode of operation;
- and
- loading said program onto said integrated circuit.
Dependencies are inferred from the claim text.