Semiconductor integrated circuit having latching means capable of scanning
AssigneeKabushiki Kaisha Toshiba
InventorRyo Fukuda
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AssigneeKabushiki Kaisha Toshiba
InventorRyo Fukuda
Estimating the term…
A plurality of first registers are connected in series, and shift stored data to respective adjacent registers in sequence. A plurality of second registers are connected in series, and shift stored data to respective adjacent registers in sequence. The plurality of first and second registers are connected in one-to-one correspondence to a plurality of input terminals or to a plurality of output terminals. A first scan input terminal is formed at one end of the plurality of first series-connected registers, and a first scan output terminal is formed at the other end. A second scan input terminal is formed at one end of the plurality of second series-connected registers, and a second scan output terminal is formed at the other end. An operation control circuit controls operations of the circuits and the plurality of first and second registers.
A semiconductor integrated circuit comprising:
A semiconductor integrated circuit comprising:
A semiconductor integrated circuit comprising:
Dependencies are inferred from the claim text.