Methods and apparatus for polarized reflectance spectroscopy
AssigneeBoard of Regents, The University of Texas System
InventorsKonstantin Sokolov, Rebekah Drezek, Urs Utzinger, Rebecca Richards-Kortum
Life of this patent
Estimating the term…
Loading patent…
AssigneeBoard of Regents, The University of Texas System
InventorsKonstantin Sokolov, Rebekah Drezek, Urs Utzinger, Rebecca Richards-Kortum
Estimating the term…
Methods and apparatus for assessing the size of a scattering element of a sample. Primary radiation is generated from a source. The primary radiation is polarized to produce polarized primary radiation. The polarized primary radiation is directed to the sample to generate reflected radiation. The reflected radiation is directed through a polarizer to produce filtered reflected radiation, the polarizer being configured to select reflected radiation parallel and perpendicular to the polarization of the polarized primary radiation. The filtered radiation is detected, and a depolarization ratio is calculated using the detected filtered radiation. The size of the scattering element is calculated using the depolarization ratio.
A method for assessing the size of a scattering element of a sample, comprising:
A method for assessing the refractive index of a scattering element of a sample, comprising:
A method for assessing the size distribution of cell nuclei of a sample, comprising:
A computer readable media containing program instructions for assessing the size of a scattering element of a sample, the computer readable media comprising:
Dependencies are inferred from the claim text.