Technique for imaging electrical contacts
AssigneeInternational Business Machines Corporation
InventorsWilliam L. Brodsky, Lawrence P. Lehman, Daniel C. Van Hart
Life of this patent
Estimating the term…
Abstract
A congruence between the element that provides an electrical conductive path in a component of micron dimensions and an imaging of that element provides a basis for predicting the effectiveness and the consistency in the functioning of the element in an actual operating environment. The element is formed first into a sandwich whereby the operating end is deformed against a light transparent surface. By directing a beam of light into the end of that light transparent surface, the asperity of the operating end produces a light scattering effect that is imaged by microscopic optics that is located facing the operating end.
Claims23
A technique for imaging a surface of a contact, which surface has asperities of micron dimensions, comprising:
- locating said contact with said surface with asperities on a first surface of a predetermined material with said asperities facing away from said first surface;
- positioning a second surface of a predetermined length and width wits at least one edge and formed of a predetermined transparent material over said contact surface having said asperities;
- affixing said first and second surfaces together to apply a predetermined force to deform said contact surface having said as asperities against said second surface;
- applying a light source to at least one end of said second, transparent surface for reflecting from said asperities;
- and
- using optical means for imaging said light reflected from said asperities.
A technique for imaging a selected surface having asperities of micron dimensions that is attached to carrier means supporting a plurality of similar contact surfaces, comprising:
- locating said carrier means on a first surface of a predetermined material with said selected surface to be imaged facing away from said first surface;
- positioning a second surface of a predetermined length and width with two ends and formed of a predetermined transparent material over said selected surface to be imaged;
- affixing said first and second surfaces together to apply a predetermined force to deform said selected surface having asperities against said second surface;
- applying a light source to at least one end of said second, transparent surface for reflecting from said asperites;
- and
- using optical means for imaging said light reflected from said asperities.
A technique for imaging electrical contact surfaces having asperities of micron dimensions that are attached to carrier means supporting a plurality of electrical contacts with first surfaces on one side and with second surfaces on the opposite side, comprising:
- selecting a first surface and a second surface formed of a transparent microscope slide material, said selected surfaces having predetermined length, width and two ends;
- locating said carrier means on said first selected surface with said plurality of contact surfaces facing away from said firs selected surface;
- positioning a second surface of a predetermined length, width and two ends over said plurality of contact surfaces that face away from said first surface;
- affixing said first surface and second surface together to apply a predetermined, adjustable force to deform said contact surfaces having asperities against said first and second surfaces;
- applying a light source to at least one end of said first surface with contact surfaces deformed for reflecting said asperities;
- locating an optical microscope substantially perpendicular over said first surface with said light reflecting said asperities for imaging said light reflected from said asperities;
- and
- reversing said first and second surfaces and said carrier means for applying said light source to at least one end of said second surface with said contact surfaces deformed for reflecting said asperities.
A technique for imaging a member having a surface formed of conductive particles, said surface having asperities in a first direction that are relatively small compared to another dimension of said surface, the technique comprising:
- locating said asperities of said surface against a first surface of predetermined length and width with at least one edge and formed of a predetermined transparent material;
- pressing said asperities of said surface against said transparent surface;
- applying a light source to at least one end of said transparent surface for reflecting from said asperities;
- and
- imaging said light reflected from said asperities for study.
Dependencies are inferred from the claim text.