Annular illumination method for charged particle projection optics
AssigneeNikon Corporation
InventorShinichi Kojima
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AssigneeNikon Corporation
InventorShinichi Kojima
Estimating the term…
A method and apparatus for aligning a charged particle beam with an aperture includes providing a hollow beam aperture device adapted for shaping a charged particle beam into a hollow charged particle beam. Then direct the charged particle beam through the aperture. Provide deflection coils for deflecting the charged particle beam relative to the aperture. Vary the current to the alignment deflection coils while measuring the aperture electrical current generated by charged particles reaching the hollow beam aperture as a function of the current to the alignment deflection coils. Then adjust the current in the alignment deflection coils based on the aperture electrical current to center the charged particle beam on the hollow beam aperture. Preferably, separate hollow beam and peripheral beam apertures with associated sensing and current are used to center the beam on respective ones of the apertures.
A method of aligning a charged particle beam with an aperture including:
A method of aligning an E-beam with an aperture including:
Apparatus for aligning a charged particle beam comprising:
The apparatus of clam 15 including a central pole suspended in the hollow beam aperture means.
Apparatus for aligning a E-beam comprising:
Dependencies are inferred from the claim text.