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US 6,639,219 B2Granted
Electron scatter in a thin membrane to eliminate detector saturation
AssigneeInternational Business Machines Corporation
InventorsRodney A. Kendall, Christopher F. Robinson
Life of this patent
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Abstract
An electron beam system employs a non-saturating detector for measuring total beam current that comprises a thin membrane of only a few microns thickness placed before a detector and separated from the detector by a drift space of about 10 mm, so that electrons in the beam are not absorbed to any significant extent, but are scattered transversely to spread the beam and avoid local saturation of the detector.
Claims8
An electron beam system comprising:
- an electron source for generating an electron beam containing a beam current;
- and
- means for directing said electron beam on to a workpiece;
- further comprising:
- a diffusing member for scattering said beam transversely;
- detector means disposed behind said diffusing member, for detecting said electron beam current and producing a signal in response thereto;
- in which
- said diffusing member has a scattering thickness such that a minor portion of said beam is absorbed therein;
- said detector means is displaced from said diffusing member by a drift distance such that said electron beam spreads sufficiently that said detector means does not saturate.
6 more elements
Dependencies are inferred from the claim text.