Image processor and image processing method
AssigneeIbiden Co., Ltd.
InventorMasahiro Okada
Life of this patent
Estimating the term…
Abstract
An image processor wherein, with respect to pixels included in a pattern image and in a plural directions from a selected pixel among pixels, a number of same kind of pixels which consecutively continues from the selected pixel is counted. A processing recognition area effective signal that shows a range in which an area to be processed exists is produced. Whether the selected pixel is a processing candidate pixel is determined based on a determination whether the number is larger, in the plural directions, than a reference value. A processing image is made by comparing the processing candidate pixel and the processing recognition area effective signal.
Claims19
An image processor comprising:
- a pattern image making unit configured to make a pattern image formed from pixel data obtained by capturing a surface of an object to be inspected, said pattern image including black pixels;
- a mask candidate pixel determining unit configured to determine whether each black pixel of said black pixels included in said pattern image is a mask candidate pixel, said mask candidate pixel determining unit comprising:
- a selecting unit configured to select one black pixel from said black pixels included in said pattern image;
- a counter configured to count in each of plural directions a pixel number of consecutive black pixels which consecutively continue from said selected one black pixel along said each of plural directions;
- a comparison unit configured to determine with respect to said each of plural directions an OK direction along which the pixel number is at most a predetermined reference pixel number;
- a determining unit configured to determine that the selected one black pixel is the mask candidate pixel when a direction number of said OK direction with respect to the selected one black pixel is at least a predetermined reference direction number;
- a general mask area storage unit configured to memorize a general mask area in which an inspection on the surface of the object is not generally performed;
- and
- a mask area determining unit configured to determine a mask area in which the inspection is not performed based on the mask candidate pixel and the general mask area.
An image processor comprising:
- pattern image making means for making a pattern image formed from pixel data obtained by capturing a surface of an object to be inspected, said pattern image including black pixels;
- mask candidate pixel determining means for determining whether each black pixel of said black pixels included in said pattern image is a mask candidate pixel, said mask candidate pixel determining means comprising:
- selecting means for selecting one black pixel from said black pixels included in said pattern image;
- counter means for counting in each of plural directions a pixel number of consecutive black pixels which consecutively continue from said selected one black pixel along said each of plural directions;
- comparison means for determining with respect to said each of plural directions an OK direction along which the pixel number is at most a predetermined reference pixel number;
- determining means for determining that the selected one black pixel is the mask candidate pixel when a direction number of said OK direction with respect to the selected one black pixel is at least a predetermined reference direction number;
- general mask area storage means for memorizing a general mask area in which an inspection on the surface of the object is not generally performed;
- and
- mask area determining means for determining a mask area in which the inspection is not performed based on the mask candidate pixel and the general mask area.
An image processing method comprising:
- making a pattern image formed from pixel data obtained by capturing a surface of an object to be inspected, said pattern image including black pixels;
- determining whether each black pixel of said black pixels included in said pattern image is a mask candidate pixel, said mask candidate pixel determining means comprising:
- selecting one black pixel from said black pixels included in said pattern image;
- counting in each of plural directions a pixel number of consecutive black pixels which consecutively continue from said selected one black pixel along said each of plural directions;
- determining with respect to said each of plural directions an OK direction along which the pixel number is at most a predetermined reference pixel number;
- determining that the selected one black pixel is the mask candidate pixel when a direction number of said OK direction with respect to the selected one black pixel is at least a predetermined reference direction number;
- memorizing a general mask area in which an inspection on the surface of the object is not generally performed;
- and
- determining means for determining a mask area in which the inspection is not performed based on the mask candidate pixel and the general mask area.
An inspection apparatus comprising:
- a pattern image making unit configured to make a pattern image formed from pixel data obtained by capturing a surface of an object to be inspected, said pattern image including black pixels;
- a mask candidate pixel determining unit configured to determine whether each black pixel of said black pixels included in said pattern image is a mask candidate pixel, said mask candidate pixel determining unit comprising:
- a selecting unit configured to select one black pixel from said black pixels included in said pattern image;
- a counter configured to count in each of plural directions a pixel number of consecutive black pixels which consecutively continue from said selected one black pixel along said each of plural directions;
- a comparison unit configured to determine with respect to said each of plural directions an OK direction along which the pixel number is at most a predetermined reference pixel number;
- a determining unit configured to determine that the selected one black pixel is the mask candidate pixel when a direction number of said OK direction with respect to the selected one black pixel is at least a predetermined reference direction number;
- a general mask area storage unit configured to memorize a general mask area in which an inspection on the surface of the object is not generally performed;
- a mask area determining unit configured to determine a mask area in which the inspection is not performed based on the mask candidate pixel and the general mask area;
- and
- an inspecting unit configured to detect a defect shape from the pattern image except for the mask area.
Dependencies are inferred from the claim text.