Inspection system and method

An inspection method for identifying particularities in a structure, the method comprising:

• placing a first gantry comprising an attached first inspection device in a position located outside of the structure;
• placing a second gantry comprising an attached second inspection device inside of the structure;
• initializing the relative positions of the first and second inspection devices;
• moving the first and second inspection devices in a coordinated manner to each of a set of data collection positions according to a programmed inspection sequence that controls movement of the first and second inspection devices along the structure;
• and
• collecting data of the structure at each data collection position.

A method for creating an inspection sequence to use in the inspection of a structure, the method comprising:

• aligning an exterior gantry having an inspection device with the structure by initializing all the axes of the exterior gantry;
• determining at least three reference points at locations on the structure;
• determining the location and orientation of the inspection device on the exterior gantry relative to the structure via triangulation to the reference points;
• determining one or more data collection positions for the inspection device on the exterior gantry;
• positioning the inspection device on the exterior gantry in an orientation to the structure at a data collection position;
• recording the data collection position of the inspection device on the exterior gantry;
• using reverse kinematics to derive interior gantry axes motions to achieve a data collection position for an inspection device on an interior gantry corresponding to a data collection position of the inspection device on the exterior gantry;
• and
• recording the corresponding data collection position for the inspection device on the interior gantry.

An inspection method for identifying defects in a structure, the method comprising:

• moving an exterior rover gantry having a x-ray detector inspection device to a pre-determined position outside the structure and registering the exterior rover gantry to the structure;
• mounting an interior rail gantry having an x-ray source inspection device onto alignment tracks at a pre-determined position inside the structure;
• aligning the x-ray detector inspection device on the exterior rover gantry with the x-ray source inspection device on the interior rail gantry;
• implementing a programmed inspection sequence to automatically move the detector inspection device and the source inspection device to each of a set of image collection positions;
• and
• obtaining an x-ray image at each image collection position with the detector inspection device and the source inspection device.

A system for inspecting particularities in a structure, the system comprising:

• a dual gantry system, wherein an exterior gantry is configured to move externally to the structure and an interior gantry is configured to move internally to the structure;
• a first inspection device mounted on the exterior gantry;
• a second inspection device mounted on the interior gantry, wherein one of the first or second inspection devices comprises a detector inspection device and the other of the first or second inspection devices comprises a source inspection device;
• and
• a gantry control system that maneuvers the detector inspection device and the source inspection device in synchronized motion with each other to each of a set of data collection positions on the structure according to a programmed inspection sequence that controls movement of the detector and source inspection devices along the structure, and wherein the detector and source inspection devices collect data at each of the set of data collection positions on the structure.