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US 6,636,315 B2Granted
Method for estimating the quality of distribution of pigments in a matrix
AssigneeKronos International, Inc.
InventorJosef Schmelzer
Life of this patent
Estimating the term…
Abstract
The quality of distribution of pigments in a matrix is estimated by measuring the reflectivity of a sample of the pigmented matrix at a shorter and a longer wavelength, and calculating a function of the two measurements. A ratio of the normalized reflectivity for broad short and long wavelength bands is the preferred function.
Claims17
A method of estimating the quality S of distribution of TiO2 pigment in a matrix, comprising:
- a) measuring F1, the reflectivity of light from the pigment in the matrix integrated over a first wavelength band from λ1 to λm;
- b) measuring F2, the reflectivity of light from the pigment in the matrix integrated over a second wavelength band from λn to λ2, and;
- b) calculating S as a function of F1 and F2.
A method of estimating the quality S of distribution of TiO2 pigment in a matrix, comprising:
- a) measuring the reflectivity of a first coating of the TiO2 pigment in the matrix as a function of wavelength from a wavelength λ1 to a wavelength λ2, where λ1<λ2;
- b) determining the wavelength λm of the maximum value the reflectivity of a coating of the TiO2 pigment in the matrix, where λ1<λm<λ2;
- c) determining F1, the reflectivity of light from the pigment in the matrix integrated over the wavelength band from λ1 to λm;
- d) determining F2, the reflectivity of light from the pigment in the matrix integrated over the second wavelength band from λm to λ2;
- and
- e) calculating S=F1/F2.
3 more elements
Dependencies are inferred from the claim text.