Insert for electric devices testing apparatus
AssigneeAdvantest Corporation
InventorNoboru Saito
Life of this patent
Estimating the term…
Abstract
An insert for an electric devices testing apparatus, including a latch portion for moving between a first position for holding over an upper surface of electric devices under test held on an insert in a second position receding from the upper surface of the electric devices under test, and a latch arm portion for rotatably supporting the latch portion on the insert body, wherein a tip of the latch portion and a rotation center of the latch arm portion are arranged at the first position on an approximately vertical line, the latch portion and the rotation center of the latch arm portion being offset in a plan view of the insert.
Claims9
An insert provided in a slightly movable state on a tray and loaded with electric devices to be tested inside an electric devices testing apparatus, the insert comprising:
- a latch portion for moving between a first position and a second position, the first position for holding the electric devices under test in said insert by covering over an upper surface of the electric devices with a clearance to prevent the electric devices from jumping out, and the second position for receding from the upper surface of said electric devices under test;
- and
- a latch arm portion for rotatably supporting said latch portion on an insert body;
- wherein a tip of said latch portion and a rotation center of said latch arm portion are arranged at the first position in an approximately vertical line crossing the upper surface of the electric devices being held in the insert in a view from a side of said insert,
- wherein said latch portion and the rotation center of said latch arm portion are offset from each other in a plan view of said insert.
Dependencies are inferred from the claim text.