Electric part testing apparatus with movable adapter
AssigneeFujitsu Limited
InventorYouji Uchikura
Life of this patent
Estimating the term…
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AssigneeFujitsu Limited
InventorYouji Uchikura
Estimating the term…
Testing apparatus for an electronic part having first and second pins includes an adapter having through-holes, and a testing plate having pads. Connecting members are arranged in the through-holes of the adapter, each connecting member including a pin contact portion, a pad contact portion, and a spring between the pin and pad contact portions. Top surfaces of pin contact portions are within the through-holes so that pins can be inserted into through-holes above the pin contact portions. The top surface of the first pin contact portion is higher than that of the second pin contact portion. The adapter is movably supported by the testing plate. During the test, as the electronic part is pressed toward the adapter, the first pins contact the first pin contact portions and the first test is carried out, first and second pins then contact first and second pin contact portions, and the adapter is then moved toward the testing plate to further enhance the connection and second test is carried out.
An electronic part testing apparatus for testing a connectability of a wiring pattern of an electronic part having a plurality of terminals, said apparatus comprising:
An electronic part testing apparatus for testing a connectability of a wiring pattern of an electronic part having a plurality of terminals, said apparatus comprising:
An electronic part testing apparatus for testing a connectability of a wiring pattern of an electronic part having a plurality of terminals, said apparatus comprising:
An electric connecting member comprising:
Dependencies are inferred from the claim text.