Low capacitance probe contact

A low capacitance probe contact comprising:

• at least first and second electrically conductive contacts having fingers extending in a first direction with opposing interior flat surfaces forming a slit there between and a mounting member extending in the opposite direction having a flat surface that is parallel to the flat surfaces of the fingers with the fingers having distal ends that are angled outward;
• a substrate having first and second electrically conductive contact pads formed thereon on which are secured the first and second electrically conductive contacts with the flat surfaces of the mounting members being positioned on the contact pads, the first and second electrically conductive contacts being inwardly angled such that the distal ends of the fingers are closer together than the mounting members secured to the substrate;
• and
• a housing having first and second members with one of the members having a base and extending sidewalls forming a recess that receives the substrate and the first and second electrically conductive contacts with the other member having a periphery coextensive with the sidewalls that is secured to the sidewalls to capture the substrate and the first and second electrically conductive contacts within the housing.

A low capacitance probe contact for a logic analyzer comprising:

• at least first and second electrically conductive contacts having first and second fingers extending in a first direction with opposing interior flat surfaces forming a slit there between and a mounting member extending in the opposite direction having a flat surface that is parallel to the flat surfaces of the fingers with the fingers having distal ends that are angled outward;
• a substrate having first and second electrically conductive input pads on which are secured the first and second electrically conductive contacts with the flat surfaces of the mounting members being positioned on the input pads, the first and second electrically conductive contacts being inwardly angled such that the distal ends of the fingers are closer together than the mounting members secured to the substrate;
• and electrical circuitry disposed on the substrate for minimizing electrical loading of signals under test coupled to the first and second electrically conductive contacts;
• a housing having first and second members with one of the members having a base and extending sidewalls forming a recess that receives the substrate and the first and second electrically conductive contacts with a dielectric insulator disposed between the fingers of the first and second electrically conductive contacts having a dielectric constant equivalent to air with the other member having a periphery coextensive with the sidewalls that is secured to the sidewalls to capture the substrate and the first and second electrically conductive contacts within the housing;
• and
• electrical leads connected to output pads of the electrical circuitry and extending from the housing.