Electrical resistivity probes
AssigneeThe Regents of the University of California
InventorsKi Ha Lee, Alex Becker, Boris A. Faybishenko, Ray D. Solbau
Life of this patent
Estimating the term…
Loading patent…
AssigneeThe Regents of the University of California
InventorsKi Ha Lee, Alex Becker, Boris A. Faybishenko, Ray D. Solbau
Estimating the term…
A miniaturized electrical resistivity (ER) probe based on a known current-voltage (I-V) electrode structure, the Wenner array, is designed for local (point) measurement. A pair of voltage measuring electrodes are positioned between a pair of current carrying electrodes. The electrodes are typically about 1 cm long, separated by 1 cm, so the probe is only about 1 inch long. The electrodes are mounted to a rigid tube with electrical wires in the tube and a sand bag may be placed around the electrodes to protect the electrodes. The probes can be positioned in a borehole or on the surface. The electrodes make contact with the surrounding medium. In a dual mode system, individual probes of a plurality of spaced probes can be used to measure local resistance, i.e. point measurements, but the system can select different probes to make interval measurements between probes and between boreholes.
A dual mode distributed measurement system comprising:
An electrical resistance (ER) tomography system, comprising:
Dependencies are inferred from the claim text.