Step function determination of Auger peak intensity
AssigneeFEI Company
InventorsDimitri Klyachko, Sergey Borodyansky, Leonid Vasilyev
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AssigneeFEI Company
InventorsDimitri Klyachko, Sergey Borodyansky, Leonid Vasilyev
Estimating the term…
An electron analyzer and its method of operation useful for determining the intensity of a peak in the electron spectrum. The invention is particularly useful for determining the intensity of an Auger peak of a given element in the sample being probed and associating the intensity with a concentration of that element in the sample. The electron spectrum is measured above and below the anticipated peak. The data near the peak are not used. The remaining data above the peak and below the peak are fit to respective equations linearly dependent upon the measurement energy. The difference of the two equations at the value of the peak energy is associated with the peak intensity and the elemental concentration. The invention can be applied to measuring nitrogen concentration in a thin protective film of amorphous carbon or diamond.
A method of analyzing data obtained from an electron energy analyzer in which a beam of probing electrons irradiates a sample and the electron energy analyzer measures intensities of resultant electrons emitted from said sample, said method comprising the steps of:
A method of analyzing an electron intensity spectrum, comprising the steps of:
An electron spectrometer system, comprising:
Dependencies are inferred from the claim text.