Measurement and correction of a scan line length error
AssigneeHewlett-Packard Development Company, L.P.
InventorB. Mark Hirst
Life of this patent
Estimating the term…
Abstract
A method for determining a scan line error for a scan line, wherein the scan line is produced from one of a plurality of facets of a rotating reflector of a scanning device. The method comprises the steps of (a) determining a difference between a time of an occurrence of a point in a scan line produced from a first facet and a time of an occurrence of a point in a scan line produced from a second facet, and (b) determining from the difference, a scan line error for the scan line produced from the first facet.
Claims21
A method for determining a scan line length error for a scan line, wherein said scan line is produced from one of a plurality of facets of a rotating reflector of a scanning device, said method comprising the steps of:
- determining a difference between a time of an occurrence of a point in a scan line produced from a first facet and a time of an occurrence of a point in a scan line produced from a second facet;
- and
- determining from said difference, a scan line length error for said scan line produced from said first facet.
A system for determining a scan line length error for a scan line, wherein said scan line is produced from one of a plurality of facets of a rotating reflector of a scanning device, said system comprising:
- a module for determining a difference between a time of an occurrence of a point in a scan line produced from a first facet and a time of an occurrence of a point in a scan line produced from a second facet;
- and
- a module for determining from said difference, a scan line length error for said scan line produced from said first facet.
A storage medium that contains instructions for controlling a processor that, in turn, determines a scan line length error for a scan line, wherein said scan line is produced from one of a plurality of facets of a rotating reflector of a scanning device, said storage medium comprising:
- instructions for controlling said processor to determine a difference between a time of an occurrence of a point in a scan line produced from a first facet and a time of an occurrence of a point in a scan line produced from a second facet;
- and
- instructions for controlling said processor to determine from said difference, a scan line length error for said scan line produced from said first facet.
A method for determining a correction for a scan line, wherein said scan line is produced from one of a plurality of facets on a rotating reflector of a scanning device, said method comprising the steps of:
- determining a facet error from a difference between a length of a scan line produced from a first facet and a length of a scan line produced from a second facet;
- and
- determining from said facet error, a correction for said scan line produced from said first facet.
A system for determining a correction for a scan line, wherein said scan line is produced from one of a plurality of facets on a rotating reflector of a scanning device, said system comprising:
- a module for determining a facet error from a difference between a length of a scan line produced from a first facet and a length of a scan line produced from a second facet;
- and
- a module for determining from said facet error, a correction for said scan line produced from said first facet.
A storage medium that contains instructions for controlling a processor that, in turn, determines a correction for a scan line, wherein said scan line is produced from one of a plurality of facets on a rotating reflector of a scanning device, said storage medium comprising:
- instructions for controlling said processor to determine a facet error from a difference between a length of a scan line produced from a first facet and a length of a scan line produced from a second facet;
- and
- instructions for controlling said processor to determine from said facet error, a correction for said scan line produced from said first facet.
Dependencies are inferred from the claim text.