Method of encapsulating a substrate-based package assembly without causing mold flash
AssigneeSiliconware Precision Industries Co., Ltd.
InventorChien-Ping Huang
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AssigneeSiliconware Precision Industries Co., Ltd.
InventorChien-Ping Huang
Estimating the term…
An improved encapsulation method is proposed for the encapsulation of a substrate-based package assembly, which can help to prevent mold flash over exposed package surfaces after encapsulation process is completed. The proposed encapsulation method is characterized by the forming of a cutaway portion in a solder mask over the substrate along a seam line between the solder mask and the molding tool that would exist between the solder mask and the molding tool when the semi-finished package assembly is fixed in position in the molding tool. During encapsulation process, the cutaway portion defines a constricted flow passage to the injected encapsulation material; and consequently, when the encapsulation material flows into this constricted flow passage, it would more quickly absorb the heat in the molding tool, thereby increasing its viscosity and retarding its flow speed. As a result, the encapsulation material would be less likely to further flow into the seam between the solder mask and the molding tool, thus preventing mold flash over the exposed surface of the solder mask.
A method for encapsulating a substrate-based package assembly including a substrate and an electrically-insulative layer formed over one surface of the substrate, the method comprising the steps of:
A method for encapsulating a substrate-based package assembly including a substrate having a front surface and a back surface, at least one semiconductor chip mounted over the front surface of the substrate, and an electrically-insulative layer formed over the back surface of the substrate, the method comprising the steps of:
A method for encapsulating a substrate-based package assembly including a substrate having a front surface and a back surface, an electrically-insulative layer formed over the front surface of the substrate, and at least one semiconductor chip mounted over the electrically-insulative layer, the method comprising the steps of:
Dependencies are inferred from the claim text.