Tomographic wavefont analysis system and method of mapping an optical system
AssigneeWaveFront Sciences, Inc.
InventorsDaniel R. Neal, Richard J. Copland
Life of this patent
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AssigneeWaveFront Sciences, Inc.
InventorsDaniel R. Neal, Richard J. Copland
Estimating the term…
A method of measuring aberrations of a three-dimensional structure of an optical system, such as an eye, includes creating a plurality of light beams, optically imaging the light beams and projecting the light beams onto different locations in an optical system, receiving scattered light from each of the locations, and detecting individual wavefronts of the scattered light. The plurality of light beams may be created and projected simultaneously or sequentially. A system for measuring aberrations of a three-dimensional structure of an optical system includes a light source creating a plurality of light beams, an optical imaging system optically imaging the light beams and projecting the light beams onto different locations in the target optical system, and a wavefront sensor receiving scattered light from each of the locations and detecting individual wavefronts of the scattered light.
A tomographic wavefront analysis system, comprising:
A tomographic wavefront analysis system, comprising:
A tomographic wavefront analysis system, comprising:
A method of measuring aberrations of a three-dimensional structure of a target optical system, comprising:
A tomographic wavefront analysis system, comprising:
A method of measuring aberrations of a three-dimensional structure of a target optical system, comprising:
A tomographic wavefront analysis system for measuring a target optical system, comprising:
A wavefront sensor for a wavefront analysis system, comprising:
A wavefront sensor for a wavefront analysis system, comprising:
A tomographic wavefront analysis system, comprising:
A method of measuring aberrations of a three-dimensional structure of an eye, comprising:
Dependencies are inferred from the claim text.