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AssigneeHewlett-Packard Development Company, L.P.
InventorsDean T. Lindsay, John A. Benavides, Kenneth D. Holloway
Estimating the term…
A system and method for testing at least one interface of a digital integrated circuit while at least one other interface of the digital integrated circuit operates in a normal mode is disclosed. Each interface includes at least one boundary scan cell such that each boundary scan cell is electrically coupled to a pin of the digital integrated circuit. The method includes selectively categorizing at least one interface into a first category. At least one other interface is selectively categorized into a second category. A first mode signal is provided to the interfaces categorized into the test mode category such that the interfaces categorized into the test mode category operate in a test mode. A second mode signal is provided to the interfaces categorized into the normal operation mode category such that the interfaces categorized into the normal operation mode category operate in a normal operation mode.
A method of testing at least one interface of a digital integrated circuit while at least one other interface of the digital integrated circuit operates in a normal operation mode, each interface having at least one boundary scan cell, each boundary scan cell electrically coupled to a pin of the digital integrated circuit, the method comprising:
A system for testing at least one interface of a digital integrated circuit categorized into a test mode category while at least one other interface of the digital integrated circuit categorized into a normal operation mode category operates in a normal operation mode, the system comprising:
A system for testing at least one interface of a digital integrated circuit while at least one other interface of the digital integrated circuit operates in a normal operation mode, the system comprising:
Dependencies are inferred from the claim text.