Decoding circuit for memories with redundancy
AssigneeLSI Logic Corporation
InventorTuan Phan
Life of this patent
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AssigneeLSI Logic Corporation
InventorTuan Phan
Estimating the term…
A system for disabling defective memory elements includes a memory array, an address decoder and a decoder element. The memory array has multiple memory elements for storing data. The address decoder receives a requested memory address and produces multiple element-select signals. Each element-select signal is associated with one of the memory elements and indicates whether access to the associated memory element is requested by the host. The decoder element receives one of the element-select signals and provides an output signal to the associated memory element. If the associated memory element is functional, the output signal enables or disables the associated memory element in accordance with the associated element-select signal. If, on the other hand, the associated memory element is defective, the output signal disables the associated memory element regardless of the associated element-select signal. The decoder element is programmed upon power-up so as not to require an address comparison for each memory access cycle.
A system for disabling defective memory elements, comprising:
A method of disabling defective memory elements of a memory array, comprising:
A system of handling defective memory elements in a memory array, comprising:
Dependencies are inferred from the claim text.