Integrated circuit with on-chip data checking resources
AssigneeMacronix International Co., Ltd.
InventorWen-Chieh Lee
Life of this patent
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Abstract
An integrated circuit with on-chip resources to support the testing of data stored on the integrated circuit includes logic to compute a check code using data, or a combination of data and addresses, of a particular data set stored on the device. The check code produced using the stored version of the data set is compared with a test code produced using a correct version of the data set, to indicate whether the correct data set was successfully stored on the device. An on-chip store holds the code produced using the correct version, and an on-chip comparator is used to produce a flag indicating the success or failure of the test. During manufacturing of the device, the memory tester simply tests the flag.
Claims40
An integrated circuit, comprising:
- an integrated circuit substrate;
- an array of non-volatile memory cells on the integrated circuit substrate storing a particular data set;
- and
- logic on the integrated circuit, and responsive to test mode signals adapted to be applied during manufacturing testing of the integrated circuit, to compute a check code using the particular data set stored in the array.
A method for manufacturing an integrated circuit including memory storing a particular data set, comprising:
- producing the integrated circuit with a stored version of the particular data set in non-volatile memory on the integrated circuit and with computational logic on the integrated circuit;
- computing a check code using the computational logic in response to data of the stored version of the particular data set;
- and
- comparing the check code with a test code computed using a correct version of the particular data set, to signal that the particular data set is correct.
A method for manufacturing integrated circuits, comprising:
- executing a sequence of processes to produce integrated circuit die on a substrate, using a mask set having a plurality of reticles per mask for forming a corresponding plurality of die per mask, at least one mask in the mask set having a first reticle having features defining a first data set stored on the die corresponding to the first reticle and at least a second reticle having features defining a second data set stored on the die corresponding to the second reticle;
- the mask set further defining a store on the die for storing a check code and defining logic for producing a code in response to the data set stored on the die, and comparing the code to the check code to produce a signal in response to the comparison;
- and
- during testing of the integrated circuit die produced, checking the signal to verify that one of the first and second data sets was successfully formed on the integrated circuit die.
A method for sorting integrated circuits, comprising:
- storing a code on the integrated circuit produced in response to a correct version of data stored in the integrated circuit as a stored version of said data;
- computing a check code in response to said stored version;
- comparing said check code with said stored code to verify said stored version;
- and
- reading said stored code to identify the integrated circuit during sorting.
An integrated circuit, comprising:
- an integrated circuit substrate;
- an array of non-volatile memory cells on the integrated circuit substrate storing a particular data set;
- logic on the integrated circuit, and responsive to test mode signals adapted to be applied during manufacturing testing, to compute a check code using the particular data set stored in the array;
- and
- a port on the integrated circuit substrate by which the check code is supplied to external devices.
An integrated circuit, comprising:
- an integrated circuit substrate;
- an array of non-volatile memory cells on the integrated circuit substrate storing a particular data set;
- logic on the integrated circuit, and responsive to test mode signals adapted to be applied during manufacturing testing, to compute a check code using the particular data set stored in the array;
- and
- read logic which supplies the particular data set in response to addresses,
- wherein the logic to compute a check code is responsive to the addresses.
An integrated circuit, comprising:
- an integrated circuit substrate;
- an array of non-volatile memory cells on the integrated circuit substrate storing a particular data set;
- and
- logic on the integrated circuit, and responsive to test mode signals adapted to be applied during manufacturing testing, to compute a check code using the particular data set stored in the array,
- wherein the logic to compute a check code comprises:
- address logic to produce addresses for reading the particular data set from the array;
- and
- arithmetic logic for computing a checksum in response to the addresses and the particular data set.
A method for manufacturing an integrated circuit including memory storing a particular data set, comprising:
- producing the integrated circuit with a stored version of the particular data set in non-volatile memory on the integrated circuit;
- computing a check code using on-chip logic in response to data of the stored version of the particular data set;
- comparing the check code with a test code computed using a correct version of the particular data set, to signal that the particular data set is correct;
- and
- read logic which supplies the particular data set in response to addresses,
- wherein the logic to compute a check code is responsive to the addresses.
A method for manufacturing an integrated circuit including memory storing a particular data set, comprising:
- producing the integrated circuit with a stored version of the particular data set in non-volatile memory on the integrated circuit;
- computing a check code using on-chip logic in response to data of the stored version of the particular data set;
- and
- comparing the check code with a test code computed using a correct version of the particular data set, to signal that the particular data set is correct,
- wherein computing a check code comprises:
- producing addresses for reading data of the particular data set;
- and
- computing a checksum in response to the addresses and data of the particular data set.
Dependencies are inferred from the claim text.