Method and apparatus for measuring opposite surfaces
AssigneeMitutoyo Corporation
InventorsKiyokazu Okamoto, Ikumatsu Fujimoto, Hirohisa Handa, Naoki Mitsutani
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AssigneeMitutoyo Corporation
InventorsKiyokazu Okamoto, Ikumatsu Fujimoto, Hirohisa Handa, Naoki Mitsutani
Estimating the term…
An interference optical system (18) leads parallel beam to a pair of opposed test surface (M1, M2). It then leads, from the test surfaces via different optical paths (C1, C2), interference fringe images formed by radiation of the parallel beam to the test surfaces (M1, M2), respectively. The interference optical system (18) has a pair of opposite reference surfaces (S1, S2) formed thereon and defined with a highly accuracy parallelism and distance. A measurement head (27) is provided with these reference surfaces (S1, S2), which are interposed between and oppose to the test surfaces (M1, M2), respectively. Imaging devices (19a, 20a) take interference fringe images that are created through interference between a light reflected at each of the test surfaces (M1, M2) and a light reflected at the corresponding reference surface (S1, S2) opposing thereto.
An apparatus for measuring the parallelism of two opposite surfaces, comprising:
A method of measuring the parallelism of two opposite surfaces, comprising:
An apparatus for measuring the parallelism of two opposite surfaces, comprising:
Dependencies are inferred from the claim text.