Semiconductor device having MOS transistor
AssigneeYamaha Corporation
InventorSeiji Hirade
Life of this patent
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Abstract
A p type well region, a field insulation film, a gate insulation film, and a gate-use poly-Si layer are formed on the surface of a silicon substrate, after which a laminate of a silicon nitride layer and a resist layer is used as a mask in ion implantation, which forms a low-concentration source region, Source contact region, drain region, and drain contact region. Side spacers are formed on both side walls of the gate-use poly-Si layer, after which the laminate of the gate-use poly-Si layer, the side spacers, and the gate insulation film is used along with the field insulation film as a mask to perform ion implantation via the silicon nitride layer, which forms a high-concentration source region and drain region. After a silicide conversion treatment, the unreacted metal is removed, which forms a silicide layer.
Claims9
A semiconductor device, comprising:
- a semiconductor substrate;
- a gate insulating layer formed on said semiconductor substrate;
- a conductive gate electrode formed on said gate insulating layer;
- insulating mask layers formed apart from said gate electrode on both sides of said gate electrode;
- an exposed source node region and an exposed drain node region formed in said semiconductor substrate between said gate electrode and said insulating mask layers;
- an exposed source contact region and an exposed drain contact region formed in said semiconductor substrate on outer sides of said insulating mask layers;
- a source region and a drain region formed in said semiconductor substrate, respectively connecting said source node region and said source contact region, and said drain node region and said drain contact region;
- and
- low resistively layers formed on and contacting said source node region and said source contact region, and said drain node region and said drain contact region.
A semiconductor device, comprising:
- a semiconductor substrate;
- a gate insulating layer formed on said semiconductor substrate;
- a conductive gate electrode formed on said gate insulating layer;
- insulating mask layers formed apart from said gate electrode on both sides of said gate electrode;
- a source node region and a drain node region formed in said semiconductor substrate between said gate electrode and said insulating mask layers;
- a source contact region and a drain contact region formed in said semiconductor substrate on outer sides of said insulating mask layers;
- a source region and a drain region formed in said semiconductor substrate, respectively connecting said source node region and said source contact region, and said drain node region and said drain contact region;
- first low resistively layers respectively formed on and contacting said source node region and said drain node region;
- and
- second low resistively layers respectively formed on and contacting said source contact region and said drain contact region.
A semiconductor device comprising:
- a semiconductor substrate;
- a gate insulating layer formed on said substrate;
- a gate electrode formed on said gate insulating layer;
- a source region and a drain region formed on both sides of the gate electrode;
- an insulating source mask layer formed on the source region, spaced from the gate insulating layer to define an exposed source node area in said source region between the gate electrode and the insulating source mask layer, and having a source contact aperture disposed apart from the source node area, which defines a source contact area in said source region;
- an insulating drain mask layer formed on the drain region, spaced from the gate insulating layer to define an exposed drain node area between the gate electrode and the insulating drain mask layer, and having a drain contact aperture disposed apart from the drain node area, which defines a drain contact area in said drain region;
- first silicide layers formed on said source node area and on said drain node area;
- and
- second silicide layers formed on said source contact area and on said drain contact area.
Dependencies are inferred from the claim text.