US 6,625,769 B1 · Method for IC fault analysis using programmable built-in self test and optical emission

Abstract

A method is provided for analyzing the functionality of an integrated circuit (IC). The method includes the step of applying a built-in self test (BIST) to the integrated circuit. The BIST includes a plurality of tests that result in the integrated circuit passing and/or failing with respect to predefined criteria. During the applying step, a substrate current of the integrated circuit is measured and analyzed as a function of at least one variable. Also during the applying step, optical emissions of the integrated circuit are measured and analyzed. Defects in the functionality of the integrated circuit are identified, based on at least one of the substrate current and the optical emissions.

Claims31

Dependent claims

A method for analyzing a functionality of an integrated circuit (IC), comprising the steps of:

applying a built-in self test (BIST) to the integrated circuit, the BIST comprising a plurality of tests that result in the integrated circuit at least one of passing and failing with respect to predefined criteria;
during said applying step:
measuring and analyzing a substrate current of the integrated circuit as a function of at least one variable;
measuring and analyzing optical emissions of the integrated circuit;
and
identifying defects in the functionality of the integrated circuit, based on at least one of the substrate current and the optical emissions.

3 more elements

Dependencies are inferred from the claim text.

Method for IC fault analysis using programmable built-in self test and optical emission

Life of this patent

Method for IC fault analysis using programmable built-in self test and optical emission

Life of this patent

Abstract

Claims31