Method, program storage device, and apparatus for optimizing and analyzing efficiency of equipment
AssigneeSamsung Electronics Co., Ltd.
InventorsJu-Seok Maeng, In-ho Hyun, Sung-tae Kim
Life of this patent
Estimating the term…
Loading patent…
AssigneeSamsung Electronics Co., Ltd.
InventorsJu-Seok Maeng, In-ho Hyun, Sung-tae Kim
Estimating the term…
A method, apparatus and program storage device for analyzing and optimizing equipment efficiency are disclosed. In an illustrative embodiment equipment running time is subdivided into a valuable operating time component and a plurality of performance loss time components. Ideal equipment reference information reflecting dynamic manufacturing parameters is simulated, and an operational performance loss is analyzed in detail. From the analysis of the operational performance loss, priority in input of resources is determined. Advantageously, parameters of a dynamically changing manufacturing environment are incorporated in the analysis and optimization of general equipment efficiency. Moreover, performance loss is more accurately analyzed compared to conventional methods. As such, the performance operating rate is more effectively utilized in reducing performance loss.
A method for analyzing and optimizing an equipment efficiency, the method comprising:
An apparatus for analyzing an equipment efficiency, comprising:
A method for analyzing and optimizing equipment efficiency, the method comprising:
A program storage device readable by a machine, said program storage device tangibly embodying a program of instructions executable by the machine to perform a process for analyzing and optimizing an equipment efficiency, wherein the process includes:
A program storage device readable by a machine, said program storage device tangibly embodying a program of instructions executable by the machine to perform a process for analyzing and optimizing an equipment efficiency, wherein the process includes:
Dependencies are inferred from the claim text.