Memory module with test mode
AssigneeMicron Technology, Inc.
InventorKevin Duesman
Life of this patent
Estimating the term…
Abstract
Embodiments of the present invention provide memory modules that mitigate the problems associated with using address pins on memory modules to supply super voltages to memory devices on the memory modules. In one embodiment, the memory module has a memory device that has a test pin. A pin of the memory module is connected to the test pin. The pin of the memory module connects the test pin to one of ground, a power source, or an open circuit when the memory module is inserted in a socket for operation. The pin of the memory module can be used to selectively supply a test voltage to the test pin when the memory module is not connected for operation.
Claims27
A memory module comprising:
- a memory device having a test pin;
- a second pin connected to the test pin, the second pin connecting the test pin to one of ground, a power source, or an open circuit when the memory module is connected for operation, the second pin for selectively supplying a test voltage to the test pin when the memory module is not connected for operation;
- and
- a diode connected between the second pin and the test pin.
A memory module comprising:
- a memory device having a test pin;
- a second pin connected to the test pin, the second pin connecting the test pin to one of ground, a power source, or an open circuit when the memory module is connected for operation, the second pin for selectively supplying a test voltage to the test pin when the memory module is not connected for operation;
- a buffer connected to the test pin;
- and
- a resistor-capacitor circuit connected between the buffer and the test pin.
A memory module comprising:
- a memory device having a test pin;
- a resistor-capacitor circuit connected to the test pin;
- a buffer connected to the resistor-capacitor circuit;
- a diode, a cathode of the diode connected to the test pin and to the resistor-capacitor circuit;
- and
- a second pin connected to the diode at an anode of the diode, the second pin connecting the test pin to ground when the memory module is connected for operation, wherein the buffer selectively transmits signals to the second pin via the resistor-capacitor circuit when the memory module is connected for operation, the second pin for selectively supplying a test voltage to the test pin via the diode when the memory module is not connected for operation.
A method for supplying a test voltage to a memory device on a memory module, the method comprising:
- electrically connecting a test pin of the memory device to a pin of the memory module, the pin of the memory module is connected to one of ground, a power source, or an open circuit when the memory module is inserted into a socket for operation;
- supplying the test voltage to the pin of the memory module when the module is not connected for operation;
- and
- preventing signals from reaching the pin of the memory module that are selectively transmitted from a buffer of the memory module to the test pin of the memory device when the memory module is connected for operation;
- wherein preventing signals from reaching the pin of the memory module comprises using a diode.
A method for supplying a test voltage to a memory device on a memory module, the method comprising:
- electrically connecting a test pin of the memory device to a pin of the memory module, the pin of the memory module is connected to one of ground, a power source, or an open circuit when the memory module is inserted into a socket for operation;
- supplying the test voltage to the pin of the memory module when the module is not connected for operation;
- and
- protecting a buffer of the memory module from the test voltage while the test voltage is supplied to the pin of the memory module.
A method for supplying a test voltage to a memory device on a memory module, the method comprising:
- connecting a test pin of the memory device to a pin of the memory module, the pin of the memory module is connected to ground when the memory module is inserted into a socket for operation;
- preventing signals from reaching the pin of the memory module that are selectively transmitted from a buffer of the memory module to the test pin of the memory device when the memory module is connected for operation;
- supplying the test voltage to the pin of the memory module when the module is not connected for operation;
- and
- protecting the buffer of the memory module from the test voltage;
- wherein preventing signals from reaching the pin of the memory module comprises using a diode.
A method for supplying a test voltage to a memory device on a memory module, the method comprising:
- connecting a test pin of the memory device to a pin of the memory module, the pin of the memory module is connected to ground when the memory module is inserted into a socket for operation;
- preventing signals from reaching the pin of the memory module that are selectively transmitted from a buffer of the memory module to the test pin of the memory device when the memory module is connected for operation;
- supplying the test voltage to the pin of the memory module when the module is not connected for operation;
- and
- protecting the buffer of the memory module from the test voltage;
- wherein protecting the buffer of the memory module from the test voltage comprises using a resistor-capacitor circuit.
A memory module comprising:
- a memory device having a test pin;
- a test interconnect pin connected to the test pin for selectively supplying a test voltage to the test pin when the memory module is not connected for operation;
- and
- a diode connected between the test interconnect pin and the test pin.
Dependencies are inferred from the claim text.