US 6,618,141 B2 · Device for measurement of the spectral reflectance and process for measurement of the spectral reflectance

Abstract

A device for measurement of the spectral reflectance of a surface where the reflectance factor of light with a certain wavelength can be measured in a wide wavelength range, including the UV range, and in which a reference reflectance factor can be easily obtained. The device for measurement has a light source part with a xenon lamp; a fiber on the incidence side; a measurement head which emits the light transmitted by the fiber via a convergent lens and a diffuser onto the surface of the measuring object and which receives the light reflected by the surface; a fiber on the exit side; and a spectroradiometer which receives the light which has been transmitted by the fiber on the exit side.

Claims10

Dependent claims

A device for measuring the spectral reflectance of the surface of a measuring object and having a light incidence side and a light exit side comprising:

a light source part comprising a xenon lamp on the incidence side;
a measurement head which emits light transmitted from the light source part via a convergent lens and a diffuser onto the surface of the measuring object and which receives the light reflected by the surface of the measuring object;
a fiber on the incidence side which transmits light from the light source part to the measurement head;
a fiber on the exit side which transmits reflected light from the surface of the measuring object which has traveled through the measurement head;
and
a spectroradiometer on the exit side which receives the reflected light which has been transmitted by the fiber on the exit side.

3 more elements

Dependencies are inferred from the claim text.

Device for measurement of the spectral reflectance and process for measurement of the spectral reflectance

Life of this patent

Device for measurement of the spectral reflectance and process for measurement of the spectral reflectance

Life of this patent

Abstract

Claims10