Mechanism for clamping device interface board to peripheral

A mechanism for attaching a DIB to a surface of a tester or peripheral, comprising:

• a base attached to the surface;
• at least one of an alignment pin and an alignment bushing on the base for establishing physical alignment of the DIB relative to the base;
• first and second pulldown mechanisms, each coupled to the base and including a rotating member coupled to at least one connecting member via a translation mechanism, the translation mechanism converting rotation of the rotating member into vertical movement of the at least one connecting member;
• and
• a substantially U-shaped actuator having first and second portions coupled to the rotating members of the first and second pulldown mechanisms,
• wherein a movement of the U-shaped actuator through an arc rotates the rotating members of the first and second pulldown mechanisms and imparts mechanical leverage for pulling down the DIB.

A method for testing electronic devices using a tester and a peripheral, comprising:

• applying a DIB to a surface of one of the tester and peripheral in alignment to latch a plurality of mating members on the DIB with a plurality of complimentarily disposed connecting members coupled to the surface;
• swinging a substantially U-shaped actuator from a first position on one side of the DIB to a second position on another side of the DIB to cause the connecting members to pull the DIB against the surface;
• docking the test head with the peripheral with the DIB disposed between the tester and the peripheral;
• and
• conveying electrical signals between the tester and devices under test to determine whether the devices operate properly.