High frequency probe for examining electric characteristics of devices

A high-frequency signal probe for testing a circuit, the probe comprising:

• a chip capacitor;
• a signal terminal to be connected to a signal electrode of a circuit to be measured;
• a first line that has an impedance, first and second ends, a length extending between the first and second ends, and a first capacitor mounting region extending along part of the length of the first line and transverse the length of the first line for mounting and connecting the chip capacitor to the first line at a plurality of positions along the first line for adjusting a characteristic impedance of the probe, the first end being connected to the signal terminal, and a first terminal of the chip capacitor being mounted on the first capacitor mounting region;
• a second line connected to the second end of the first line, remote from the signal terminal, and having a junction to be connected to a measuring instrument for electrical testing, and an impedance matched to a characteristic impedance of the measuring instrument;
• a ground terminal to be connected to a ground electrode of the circuit to be measured;
• and
• a ground conductor connected to the ground terminal and having at least one second capacitor mounting region extending opposite and parallel to the first capacitor mounting region for connecting the chip capacitor at a plurality of positions for adjusting the characteristic impedance of the probe and to which a second terminal of the chip capacitor is mounted, wherein the chip capacitor has a specified capacitance and is mounted at positions within the first capacitor mounting region and the second capacitor mounting region so that the characteristic impedance of the probe, viewed from the circuit to be measured, has a desired value.