Apparatus and method for detecting electromagnetic wave source, and method for analyzing the same
AssigneeHitachi, Ltd.
InventorsKouichi Uesaka, Kenichi Shinbo
Life of this patent
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AssigneeHitachi, Ltd.
InventorsKouichi Uesaka, Kenichi Shinbo
Estimating the term…
An electromagnetic wave source detecting apparatus may include a plurality of probes for measuring intensities of an electric field or magnetic field generated from an object to be measured at each measuring position. Calculation means may calculate a phase difference or time difference between electric fields or magnetic fields associated with the probes from the electric field or magnetic field intensities measured by the individual plural probes. A position of an electromagnetic wave source existing in the measured object may be calculated and identified by using the phase difference or time difference thus calculated. A magnitude of a current existing in the electromagnetic wave source at the position thus calculated may be identified on the basis of the electric field or magnetic field intensities thus measured.
An electromagnetic wave source detecting apparatus comprising:
An electromagnetic wave source analyzing system comprising an electromagnetic wave source detecting apparatus and a display device for displaying information related to an electromagnetic wave detecting apparatus, wherein said electromagnetic wave source detecting apparatus includes:
Dependencies are inferred from the claim text.